EMC Laboratory Statistical Process Control (SPC)
Measurement system variability in a test laboratory can be a source of discomfort for the test engineer, the designer and management. This is especially true in small development laboratories where there is a question of exactly what effect a design change had on system behavior. The use of Statistical Process Control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system setup, and in the data it produces.
However, the use of SPC in an EMC Lab, especially for frequency domain measurements, requires decisions to limit the quantity of the data to avoid information overload. To accomplish this careful selection of the measurement methods is essential.